A New Analytical Model for Predicting dv/dt-induced...

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IEEE Transactions on Power Electronics 2018

A New Analytical Model for Predicting dv/dt-induced Low-side MOSFET False Turn-on in Synchronous Buck Converters

Li, Ruqi, Zhu, Joyce, Xie, Manjing
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Year:
2018
Language:
english
Journal:
IEEE Transactions on Power Electronics
DOI:
10.1109/TPEL.2018.2868711
File:
PDF, 1.75 MB
english, 2018
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