Identification of the Structures and Sources of...

Crystal Research and Technology 2018 / 08

Identification of the Structures and Sources of Shockley-Type In-Grown Stacking Faults in 4H-SiC Epilayers

Li, Zhe, Zhang, Li-Guo, Zhang, Ze-Hong, Ju, Tao, Zhang, Xuan, Zhang, Bao-Shun
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Language:
english
Journal:
Crystal Research and Technology
DOI:
10.1002/crat.201700234
Date:
August, 2018
File:
PDF, 2.04 MB
english, 2018
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