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Problems of noise modeling in the presence of total current branching in high electron mobility transistor and field-effect transistor channels
Shiktorov, P, Starikov, E, Gružinskis, V, Varani, L, Sabatini, G, Marinchio, H, Reggiani, LVolume:
2009
Language:
english
Journal:
Journal of Statistical Mechanics: Theory and Experiment
DOI:
10.1088/1742-5468/2009/01/P01047
Date:
January, 2009
File:
PDF, 806 KB
english, 2009