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[IEEE 2018 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Singapore (2018.7.16-2018.7.19)] 2018 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - High Voltage InGaN/GaN/AlGaN RTD Suitable for ESD Protection Applications of GaN/InGaN-based Devices and ICs Validated by Simulation Results
Haipeng, Zhang, Lu, Geng, Mi, Lin, Zhonghai, Zhang, Weifeng, Lu, Xiaoyuan, Wang, Ying, Wang, Qiang, Zhang, Jianling, Bai, Dejun, WangYear:
2018
Language:
english
DOI:
10.1109/IPFA.2018.8452592
File:
PDF, 1.01 MB
english, 2018