[IEEE 2018 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS) - Granada (2018.3.19-2018.3.21)] 2018 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS) - Z 2 -FET memory matrix in 28 nm FDSOI technology
Parihar, Mukta Singh, Lee, Kyung Hwa, Park, Hyung Jin, Navarro, Carlos, Lacord, Joris, Gamiz, Francisco, Galy, Philippe, Cristoloveanu, Sorin, Bawedin, MarylineYear:
2018
Language:
english
DOI:
10.1109/ULIS.2018.8354341
File:
PDF, 339 KB
english, 2018