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Characterization of oxide trap density with the charge pumping technique in dual-layer gate oxide
Son, Younghwan, Kim, Yoon, Kang, MyounggonVolume:
14
Year:
2017
Language:
english
Journal:
IEICE Electronics Express
DOI:
10.1587/elex.14.20170141
File:
PDF, 1.03 MB
english, 2017