Optical and Electrical Characterizations of Nanoscale Robust 3C-SiC Membrane for UV Sensing Applications
Foisal, A.R.M., Dinh, T., Iacopi, A., Hold, L., Streed, E.W., Dao, D.V.Volume:
775
Language:
english
Journal:
Key Engineering Materials
DOI:
10.4028/www.scientific.net/KEM.775.278
Date:
August, 2018
File:
PDF, 1.37 MB
english, 2018