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[IEEE 2018 IEEE European Test Symposium (ETS) - Bremen (2018.5.28-2018.6.1)] 2018 IEEE 23rd European Test Symposium (ETS) - Automatic generation of in-circuit tests for board assembly defects
van Schaaijk, Harm, Spierings, Martien, Marinissen, Erik JanYear:
2018
Language:
english
DOI:
10.1109/ETS.2018.8400714
File:
PDF, 461 KB
english, 2018