Application of X-ray fluorescence holography to the...

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Surface and Interface Analysis 2018 / 09

Application of X-ray fluorescence holography to the analysis of the interior and surface of an yttrium oxide thin film

Stellhorn, Jens R., Hosokawa, Shinya, Happo, Naohisa, Tajiri, Hiroo, Matsushita, Tomohiro, Kaminaga, Kenichi, Fukumura, Tomoteru, Hasegawa, Tetsuya, Kimura, Koji, Hayashi, Kouichi, Watts, John
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Language:
english
Journal:
Surface and Interface Analysis
DOI:
10.1002/sia.6550
Date:
September, 2018
File:
PDF, 767 KB
english, 2018
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