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High-Temperature BSE and EBAC Electronics for ESEM
Joachimi, Wolfgang, Hemmleb, Matthias, Grauel, Uwe, Wang, Zhu-Jun, Willinger, Marc, Moldovan, GrigoreVolume:
24
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/S1431927618003963
Date:
August, 2018
File:
PDF, 705 KB
english, 2018