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Direct Electromagnetic Structure Observation by Aberration-corrected Differential Phase Contrast Scanning Transmission Electron Microscopy
Shibata, N., Findlay, S.D., Matsumoto, T., Seki, T., Sánchez-Santolino, G., Kohno, Y., Sawada, H., Sasaki, H., So, Y.G., Ishikawa, R., Ikuhara, Y.Volume:
22
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927616005377
Date:
July, 2016
File:
PDF, 1.38 MB
english, 2016