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Fault-tolerant design and analysis of QCA-based circuits
Singh, Gurmohan, Raj, Balwinder, Sarin, Rakesh K.Volume:
12
Language:
english
Journal:
IET Circuits, Devices & Systems
DOI:
10.1049/iet-cds.2017.0505
Date:
September, 2018
File:
PDF, 3.44 MB
english, 2018