[IEEE 2018 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Singapore (2018.7.16-2018.7.19)] 2018 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Study of the Long-Term Electrical Stability of InGaZnO 3-D Film-Profile-Engineered Inverters
Kuan, Chin-I, Lin, Horng-Chih, Li, Pei-WenYear:
2018
Language:
english
DOI:
10.1109/ipfa.2018.8452582
File:
PDF, 672 KB
english, 2018