Measurement System Analysis for Binary Inspection: Continuous Versus Dichotomous Measurands
De Mast, Jeroen, Erdmann, Tashi P., Van Wieringen, Wessel N.Volume:
43
Language:
english
Journal:
Journal of Quality Technology
DOI:
10.1080/00224065.2011.11917849
Date:
April, 2011
File:
PDF, 667 KB
english, 2011