[IEEE 2018 International Conference on Optical MEMS and Nanophotonics (OMN) - Lausanne, Switzerland (2018.7.29-2018.8.2)] 2018 International Conference on Optical MEMS and Nanophotonics (OMN) - Linearization of an Electrostatic Microscanner with Concentrically Tilted Stationary Comb Electrodes
Moon, Seunghwan, Kim, Kwanghyun, Lee, Jaekwon, Park, Yangkyu, Lee, Sang-Jin, Son, Sihyung, Lee, Jong-HyunYear:
2018
DOI:
10.1109/omn.2018.8454608
File:
PDF, 691 KB
2018