Characterization of thin fullerene/cadmium telluride films and their stability under x-ray radiation by IR spectroscopy
Romanov, N. M., Zakharova, I. B., Lähderanta, E.Volume:
84
Language:
english
Journal:
Journal of Optical Technology
DOI:
10.1364/JOT.84.000833
Date:
December, 2017
File:
PDF, 772 KB
english, 2017