Texture analysis and epitaxial relationships in Bi2Te3 thin...

Applied Surface Science 2019 / 01 Vol. 464

Texture analysis and epitaxial relationships in Bi2Te3 thin film grown by physical vapor transport on silicon substrates

Concepción, Omar, Tavira, Adolfo, Roque, Jorge, de Melo, Osvaldo, Escobosa, Arturo
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Volume:
464
Language:
english
Journal:
Applied Surface Science
DOI:
10.1016/j.apsusc.2018.09.065
Date:
January, 2019
File:
PDF, 2.31 MB
english, 2019
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