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[IEEE 2018 IEEE 15th Specialist Meeting on Microwave Radiometry and Remote Sensing of the Environment (MicroRad) - Cambridge, MA, USA (2018.3.27-2018.3.30)] 2018 IEEE 15th Specialist Meeting on Microwave Radiometry and Remote Sensing of the Environment (MicroRad) - Spectrum Management and the Impact of RFI on Science Sensors
Cruz-Pol, Sandra, Van Zee, Liese, Kassim, Namir, Blackwell, William, Le Vine, David, Scott, AgnesYear:
2018
DOI:
10.1109/MICRORAD.2018.8430720
File:
PDF, 291 KB
2018