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[IEEE 2018 2nd International Conference on Electronics, Materials Engineering & Nano-Technology (IEMENTech) - Kolkata, India (2018.5.4-2018.5.5)] 2018 2nd International Conference on Electronics, Materials Engineering & Nano-Technology (IEMENTech) - Automatic Identification of Fracture Region within Bone in X-ray Image
Ghosh, Ananya, Saha, SatadalYear:
2018
Language:
english
DOI:
10.1109/IEMENTECH.2018.8465196
File:
PDF, 3.52 MB
english, 2018