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[IEEE 2018 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Singapore (2018.7.16-2018.7.19)] 2018 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Prediction of Electrical and Physical Failure Analysis Success Using Artificial Neural Networks
Zhao, Lin, Goh, SH, Chan, YH, Yeoh, BL, Hu, Hao, Thor, MH, Tan, Alan, Lam, JeffreyYear:
2018
Language:
english
DOI:
10.1109/IPFA.2018.8452176
File:
PDF, 1.28 MB
english, 2018