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Microstructure of Erbium Oxide Thin Film on SUS316 Substrate with Y2O3 or CeO2 Buffer Layers Formed by MOCVD Method
Lee, Seungwon, Shinkawa, Takayuki, Matsuda, Kenji, Tanaka, Masaki, Hishinuma, Yoshimitsu, Nishimura, Katsuhiko, Tanaka, Teruya, Muroga, Takeo, Sato, TakahiroVolume:
58
Year:
2017
Language:
english
Journal:
MATERIALS TRANSACTIONS
DOI:
10.2320/matertrans.m2016313
File:
PDF, 2.22 MB
english, 2017