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[IEEE 2018 Annual American Control Conference (ACC) - Milwaukee, WI, USA (2018.6.27-2018.6.29)] 2018 Annual American Control Conference (ACC) - Control-observer technique for surface imaging with an experimental platform of Scanning-Tunneling-Microscope type
Popescu, Andrei, Besancon, Gildas, Voda, Alina, Basrour, SkandarYear:
2018
Language:
english
DOI:
10.23919/ACC.2018.8430882
File:
PDF, 1.55 MB
english, 2018