SAE Technical Paper Series [SAE International International Congress & Exposition - (FEB. 26, 1996)] SAE Technical Paper Series - Side Impact Assessment Using Drop Testing
Reid, John D., Weins, William N., Ekstrom, Ralph E., Paulsen, Gene, McConnell, David S.Volume:
1
Year:
1996
Language:
english
DOI:
10.4271/961012
File:
PDF, 1.24 MB
english, 1996