Reciprocal space mapping and strain scanning using X-ray...

Journal of Applied Crystallography 2018 / 10 Vol. 51; Iss. 5

Reciprocal space mapping and strain scanning using X-ray diffraction microscopy

Poulsen, H. F., Cook, P. K., Leemreize, H., Pedersen, A. F., Yildirim, C., Kutsal, M., Jakobsen, A. C., Trujillo, J. X., Ormstrup, J., Detlefs, C.
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Volume:
51
Language:
english
Journal:
Journal of Applied Crystallography
DOI:
10.1107/s1600576718011378
Date:
October, 2018
File:
PDF, 817 KB
english, 2018
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