![](/img/cover-not-exists.png)
[IEEE 2018 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Singapore (2018.7.16-2018.7.19)] 2018 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Radiation Hardness Testing of Super-Junction Power Mosfets by Heavy Ion Induced SEE Mapping
Gerold, M., Bergmaier, A., Greubel, C., Reindl, J., Dollinger, G., Rub, M.Year:
2018
Language:
english
DOI:
10.1109/IPFA.2018.8452587
File:
PDF, 2.92 MB
english, 2018