SAE International Journal of Passenger Cars - Electronic and Electrical Systems
2008 / 04 Vol. 1; Iss. 1
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Automated Instrument Panel Cluster Testing using Hardware in the Loop Simulators
Nagaraj, Shreyas C., Muli, Mahendra D.Volume:
1
Language:
english
Journal:
SAE International Journal of Passenger Cars - Electronic and Electrical Systems
DOI:
10.4271/2008-01-1223
Date:
April, 2008
File:
PDF, 647 KB
english, 2008