Detailed characterization of good-quality SnS thin films...

Materials Science in Semiconductor Processing 2019 / 01 Vol. 89

Detailed characterization of good-quality SnS thin films obtained by chemical solution deposition at different reaction temperatures

Cabrera-German, D., García-Valenzuela, J.A., Cota-Leal, M., Martínez-Gil, M., Aceves, R., Sotelo-Lerma, M.
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Volume:
89
Language:
english
Journal:
Materials Science in Semiconductor Processing
DOI:
10.1016/j.mssp.2018.09.009
Date:
January, 2019
File:
PDF, 2.00 MB
english, 2019
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