![](/img/cover-not-exists.png)
Improving the STEM Spatial Resolution Limit
Krivanek, Ondrej L., Bleloch, Andrew L., Dellby, Niklas, Lovejoy, Tracy C., Shi, Chenglong, Zhou, WuVolume:
24
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/S1431927618000582
Date:
August, 2018
File:
PDF, 521 KB
english, 2018