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[IEEE 2018 IEEE International Memory Workshop (IMW) - Kyoto (2018.5.13-2018.5.16)] 2018 IEEE International Memory Workshop (IMW) - Switching and Failure Mechanism of Self-Selective Cell in 3D VRRAM by RTN-Based Defect Tracking Technique
Gong, Tiancheng, Luo, Qing, Lv, Hangbing, Xu, Xiaoxin, Yu, Jie, Yuan, Peng, Dong, Danian, Chen, Chuanbing, Yin, Jiahao, Tai, Lu, Zhu, Xi, Long, Shibing, Liu, Qi, Liu, MingYear:
2018
Language:
english
DOI:
10.1109/IMW.2018.8388852
File:
PDF, 3.30 MB
english, 2018