[IEEE 2018 IEEE International Test Conference in Asia (ITC-Asia) - Harbin, China (2018.8.15-2018.8.17)] 2018 IEEE International Test Conference in Asia (ITC-Asia) - Radiation Hardening by Design of a Novel Double-Node-Upset-Tolerant Latch Combined with Layout Technique
Yan, Aibin, Chen, Zhile, Huang, Zhengfeng, Fang, Xiangsheng, Yi, Maoxiang, Guo, JingYear:
2018
Language:
english
DOI:
10.1109/ITC-Asia.2018.00019
File:
PDF, 1.17 MB
english, 2018