Studying Aging-Related Bug Prediction Using Cross-Project Models
Qin, Fangyun, Zheng, Zheng, Qiao, Yu, Trivedi, Kishor S.Year:
2018
Language:
english
Journal:
IEEE Transactions on Reliability
DOI:
10.1109/tr.2018.2864960
File:
PDF, 5.34 MB
english, 2018