Failure Mechanism of a Low-Energy-Triggered Bulk Gallium...

IEEE Transactions on Electron Devices 2018 / 9 Vol. 65; Iss. 9

Failure Mechanism of a Low-Energy-Triggered Bulk Gallium Arsenide Avalanche Semiconductor Switch: Simulated Analysis and Experimental Results

Hu, Long, Su, Jiancang, Qiu, Ruicheng, Fang, Xu, Wang, Jingxuan
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Volume:
65
Language:
english
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/TED.2018.2859231
Date:
September, 2018
File:
PDF, 1.32 MB
english, 2018
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