Cross-sectional STEM Imaging and Spectroscopy of Devices...

Cross-sectional STEM Imaging and Spectroscopy of Devices with Embedded 2D Materials

Wu, Ryan J., Reifsnyder Hickey, Danielle, Mkhoyan, K. Andre
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Volume:
23
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/S1431927617007863
Date:
July, 2017
File:
PDF, 288 KB
english, 2017
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