[IEEE 2018 55th ACM/ESDA/IEEE Design Automation Conference...

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[IEEE 2018 55th ACM/ESDA/IEEE Design Automation Conference (DAC) - San Francisco, CA, USA (2018.6.24-2018.6.28)] 2018 55th ACM/ESDA/IEEE Design Automation Conference (DAC) - An Efficient Timestamp-Based Monitoring Approach to Test Timing Constraints of Cyber-Physical Systems

Mehrabian, Mohammadreza, Khayatian, Mohammad, Mousa, Ahmed, Shrivastava, Aviral, Li-Baboud, Ya-Shian, Derler, Patricia, Griffor, Edward, Andrade, Hugo A., Wiess, Marc, Eidson, John C., Anand, Dhananja
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Year:
2018
Language:
english
DOI:
10.1109/DAC.2018.8465868
File:
PDF, 6.11 MB
english, 2018
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