[IEEE 2017 IEEE International WIE Conference on Electrical and Computer Engineering (WIECON-ECE) - Dehradun, India (2017.12.18-2017.12.19)] 2017 IEEE International WIE Conference on Electrical and Computer Engineering (WIECON-ECE) - Gate Length Engineering Impact of Sub-10 nm GaN-Based DG-MOSFETs
Hasan, Md. Rokib, Rafa, Muniyat Siddiqui, Hossain, Marwan, Rafia, Farah, Nidhi, Maisha RashidYear:
2017
Language:
english
DOI:
10.1109/WIECON-ECE.2017.8468884
File:
PDF, 951 KB
english, 2017