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[OSA CLEO: Applications and Technology - San Jose, California (2018..-..)] Conference on Lasers and Electro-Optics - Deep Learning Microscopy: Enhancing Resolution, Field-of-View and Depth-of-Field of Optical Microscopy Images Using Neural Networks
Rivenson, Yair, Göröcs, Zoltán, Günaydın, Harun, Zhang, Yibo, Wang, Hongda, Ozcan, AydoganYear:
2018
Language:
english
DOI:
10.1364/CLEO_AT.2018.AM1J.5
File:
PDF, 256 KB
english, 2018