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Surface potential measurement of n-type organic semiconductor thin films by mist deposition via Kelvin probe microscopy
Odaka, Akihiro, Satoh, Nobuo, Katori, ShigetakaVolume:
56
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.7567/JJAP.56.08LB04
Date:
August, 2017
File:
PDF, 778 KB
english, 2017