![](/img/cover-not-exists.png)
TOF-SIMS Analysis with High Lateral and High Mass Resolution in Parallel
Kollmer, Felix, Havercroft, Nathan, Henss, Anja, Arlinghaus, Henrik, Paul, Wolfgang, Moellers, Rudolf, Niehuis, EwaldVolume:
24
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/S1431927618005627
Date:
August, 2018
File:
PDF, 726 KB
english, 2018