TOF-SIMS Analysis with High Lateral and High Mass...

TOF-SIMS Analysis with High Lateral and High Mass Resolution in Parallel

Kollmer, Felix, Havercroft, Nathan, Henss, Anja, Arlinghaus, Henrik, Paul, Wolfgang, Moellers, Rudolf, Niehuis, Ewald
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Volume:
24
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/S1431927618005627
Date:
August, 2018
File:
PDF, 726 KB
english, 2018
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