Low power and high speed design issues of CMOS  Hamming...

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Microsystem Technologies 2018 / 9

Low power and high speed design issues of CMOS  Hamming code generation and error detection circuit at 22 nm and 16 nm channel length of MOS transistor

Bari, Surajit, De, Debashis, Sarkar, Angsuman
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Language:
english
Journal:
Microsystem Technologies
DOI:
10.1007/s00542-018-4143-4
Date:
September, 2018
File:
PDF, 3.54 MB
english, 2018
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