![](/img/cover-not-exists.png)
[IEEE 2017 IEEE Applied Imagery Pattern Recognition Workshop (AIPR) - Washington, DC, USA (2017.10.10-2017.10.12)] 2017 IEEE Applied Imagery Pattern Recognition Workshop (AIPR) - Satellite Image Classification with Deep Learning
Pritt, Mark, Chern, GaryYear:
2017
Language:
english
DOI:
10.1109/AIPR.2017.8457969
File:
PDF, 1.91 MB
english, 2017