NBTI-Related Variability Impact on 14-nm Node FinFET SRAM...

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IEEE Transactions on Electron Devices 2018

NBTI-Related Variability Impact on 14-nm Node FinFET SRAM Performance and Static Power: Correlation to Time Zero Fluctuations

Mishra, Subrat, Parihar, Narendra, R, Anandkrishnan, Dabhi, Chetan K., Chauhan, Yogesh S., Mahapatra, Souvik
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Year:
2018
Language:
english
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/TED.2018.2869669
File:
PDF, 2.17 MB
english, 2018
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