Synchrotron Micro-XRF Measurements of Trace Element...

Transactions of The Japan Institute of Electronics Packaging 2010 Vol. 3; Iss. 1

Synchrotron Micro-XRF Measurements of Trace Element Distributions in BGA Type Solders and Solder Joints

Nogita, Kazuhiro, Yasuda, Hideyuki, Gourlay, Christopher M., Suenaga, Shoichi, Tsukamoto, Hideaki, Mcdonald, Stuart D., Takeuchi, Akihisa, Uesugi, Kentaro, Suzuki, Yoshio
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
3
Year:
2010
Language:
english
Journal:
Transactions of The Japan Institute of Electronics Packaging
DOI:
10.5104/jiepeng.3.40
File:
PDF, 702 KB
english, 2010
Conversion to is in progress
Conversion to is failed