Influence of distortions of recorded diffraction patterns on strain analysis by nano-beam electron diffraction
Mahr, Christoph, Müller-Caspary, Knut, Ritz, Robert, Simson, Martin, Grieb, Tim, Schowalter, Marco, Krause, Florian F., Lackmann, Anastasia, Soltau, Heike, Wittstock, Arne, Rosenauer, AndreasVolume:
196
Language:
english
Journal:
Ultramicroscopy
DOI:
10.1016/j.ultramic.2018.09.010
Date:
January, 2019
File:
PDF, 4.18 MB
english, 2019