Large-scale analysis of high-speed atomic force microscopy...

Beilstein Journal of Nanotechnology 2012 / 11 Vol. 3

Large-scale analysis of high-speed atomic force microscopy data sets using adaptive image processing

Erickson, Blake W, Coquoz, Séverine, Adams, Jonathan D, Burns, Daniel J, Fantner, Georg E
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Volume:
3
Language:
english
Journal:
Beilstein Journal of Nanotechnology
DOI:
10.3762/bjnano.3.84
Date:
November, 2012
File:
PDF, 2.01 MB
english, 2012
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