Surface passivation and optical characterization of Al...

Beilstein Journal of Nanotechnology 2013 / 11 Vol. 4

Surface passivation and optical characterization of Al 2 O 3 /a-SiC x stacks on c-Si substrates

López, Gema, Ortega, Pablo R, Voz, Cristóbal, Martín, Isidro, Colina, Mónica, Morales, Anna B, Orpella, Albert, Alcubilla, Ramón
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Volume:
4
Language:
english
Journal:
Beilstein Journal of Nanotechnology
DOI:
10.3762/bjnano.4.82
Date:
November, 2013
File:
PDF, 385 KB
english, 2013
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