Improved atomic force microscopy cantilever performance by...

Beilstein Journal of Nanotechnology 2015 / 07 Vol. 6

Improved atomic force microscopy cantilever performance by partial reflective coating

Schumacher, Zeno, Miyahara, Yoichi, Aeschimann, Laure, Grütter, Peter
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Volume:
6
Language:
english
Journal:
Beilstein Journal of Nanotechnology
DOI:
10.3762/bjnano.6.150
Date:
July, 2015
File:
PDF, 781 KB
english, 2015
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