An ellipsometric approach towards the description of inhomogeneous polymer-based Langmuir layers
Rottke, Falko O, Schulz, Burkhard, Richau, Klaus, Kratz, Karl, Lendlein, AndreasVolume:
7
Language:
english
Journal:
Beilstein Journal of Nanotechnology
DOI:
10.3762/bjnano.7.107
Date:
August, 2016
File:
PDF, 3.89 MB
english, 2016