Interface properties probed by active THz surface emission...

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ACS Applied Materials & Interfaces 2018 / 09

Interface properties probed by active THz surface emission in graphene/SiO 2 /Si heterostructures

Yao, Zehan, Zhu, Lipeng, Huang, Yuanyuan, Zhang, Longhui, Du, Wanyi, Lei, Zhen, Soni, Ajay, Xu, Xin Long
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Language:
english
Journal:
ACS Applied Materials & Interfaces
DOI:
10.1021/acsami.8b11301
Date:
September, 2018
File:
PDF, 1.49 MB
english, 2018
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