Effect of Radiation-Induced Defects Produced by Low-Energy...

Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques 2018 / 5 Vol. 12; Iss. 3

Effect of Radiation-Induced Defects Produced by Low-Energy Protons in a Heavily Doped Layer on the Characteristics of n+‒p‒p+ Si Structures

Agafonov, Y. A., Bogatov, N. M., Grigorian, L. R., Zinenko, V. I., Kovalenko, A. I., Kovalenko, M. S., Kolokolov, F. A.
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Volume:
12
Language:
english
Journal:
Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques
DOI:
10.1134/S1027451018030035
Date:
May, 2018
File:
PDF, 279 KB
english, 2018
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