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[IEEE 2018 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Singapore (2018.7.16-2018.7.19)] 2018 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Soft Defect Analysis on Advanced Logic Integrated Circuit by Dynamic Laser Stimulation
Kim, Beomjun, Kim, Juhyun, Cho, Wookhyun, Cho, Seongjun, Won, Seokjun, Kim, JinsungYear:
2018
Language:
english
DOI:
10.1109/IPFA.2018.8452488
File:
PDF, 755 KB
english, 2018